Name: Structure and Electronic Properties of Ultrathin in Films on Si(111) (en Inglés)
Price: 894.28 PEN
Availability: InStock
Author: Terakawa, Shigemi
ISBN: 9789811968716

portada Structure and Electronic Properties of Ultrathin in Films on Si(111) (en Inglés)

Formato

Libro Físico

Autor

Shigemi Terakawa

Editorial

Springer

Idioma

Inglés

N° páginas

Encuadernación

Tapa Dura

Dimensiones

23.0 x 14.8 x 1.0 cm

Peso

0.29 kg.

ISBN13

9789811968716

Categorías

Fïsica de la materia condensada
Química inorgánica
Ingeniería aplicada de revestimientos de superficies, capas y películas

Structure and Electronic Properties of Ultrathin in Films on Si(111) (en Inglés)

Shigemi Terakawa (Autor) · Springer · Tapa Dura

Libro Físico

S/ 894,28

S/ 1.788,56

Ahorras: S/ 894,28

50% descuento

Envío normal

Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Structure and Electronic Properties of Ultrathin in Films on Si(111) (en Inglés)"

This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called "rect" has been extensively investigated as a two-dimensional metal. Another crystalline phase called "hex" was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds.The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them andanalyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.