Name: Modern Techniques of Surface Science 2nd Edition Paperback (Cambridge Solid State Science Series) (en Inglés)
Price: 618.10 PEN
Availability: InStock
Author: Woodruff, D. P. ; Delchar, T. A.
ISBN: 9780521424981

portada Modern Techniques of Surface Science 2nd Edition Paperback (Cambridge Solid State Science Series) (en Inglés)

Formato

Libro Físico

Autor

D. P. Woodruff

T. A. Delchar

Editorial

Cambridge University Press

Año

1994

Idioma

Inglés

N° páginas

608

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.8 x 3.9 cm

Peso

0.90 kg.

ISBN

0521424984

ISBN13

9780521424981

N° edición

0002

Categorías

Fïsica de la materia condensada
Ciencia de materiales

Modern Techniques of Surface Science 2nd Edition Paperback (Cambridge Solid State Science Series) (en Inglés)

D. P. Woodruff (Autor) · T. A. Delchar (Autor) · Cambridge University Press · Tapa Blanda

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Reseña del libro "Modern Techniques of Surface Science 2nd Edition Paperback (Cambridge Solid State Science Series) (en Inglés)"

The book describes the physical basis of all of the principal and the majority of the more specialized techniques used today in studies of well-characterized solid surfaces. The techniques are grouped according to the underlying physics and are described in nine chapters. The treatment of each technique concentrates on the basic physical principles, and illustrates its use with selected examples with an emphasis on understanding the concepts. Included in each of these discussions is a view of the strengths, the weaknesses, and the complementary aspects of the individual methods. Although some mention is included of the potential use of some of the methods to study technical surfaces, the emphasis of the examples is taken from studies of the basic chemistry and physics of well-characterized surfaces under ultra-high vacuum conditions, aimed at elucidating their structural, compositional, electronic, and vibrational properties. This edition includes new material on synchrotron radiation related techniques, scanning tunnelling microscopy and spectroscopy, and Raman spectroscopy.