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in-situ electron microscopy: applications in physics, chemistry and materials science
Gerhard Dehm, James M. Howe, Josef Zweck (Autor)
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wiley-vch
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in-situ electron microscopy: applications in physics, chemistry and materials science - gerhard dehm, james m. howe, josef zweck
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Reseña del libro "in-situ electron microscopy: applications in physics, chemistry and materials science"
the book explains firstly the basic principles of modern focused ion beam workstations (fib), scanning electron microscopes (sem) and transmission electron microscopes (tem) and subsequently what kind of in-situ experiments can be performed to obtain information on the various material properties. information on the test techniques, data evaluation, and interpretation of the obtained results is provided by leading experts in the field.