Name: Applied Statistical Science v: 5 (en Inglés)
Price: 501.67 PEN
Availability: InStock
Author: M Ahsanullah; J Kennyon; S K Sarkar
ISBN: 9781560729235

portada Applied Statistical Science v: 5 (en Inglés)

Formato

Libro Físico

Editorial

Nova Science Publishers Inc

Autor

M Ahsanullah; J Kennyon; S K Sarkar

Año

2001

Idioma

Inglés

N° páginas

287

Encuadernación

Tapa Dura

ISBN13

9781560729235

Applied Statistical Science v: 5 (en Inglés)

M Ahsanullah; J Kennyon; S K Sarkar (Autor) · Nova Science Publishers Inc · Tapa Dura

Libro Físico

S/ 501,67

S/ 1.003,35

Ahorras: S/ 501,67

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Reseña del libro "Applied Statistical Science v: 5 (en Inglés)"

Contents: Point Estimators and Tests of Hypothesis for the Parameters of the Classical Extreme Value Distributions; Distributions between Uniform and Exponential; Stability Analysis of Pharmaceutical Products in Multiple Batches: Preliminary Test and Shrinkage Approach; Can Respondent-Generated Interval Estimation in Sample Surveys Reduce Item Non Response?; Penalised Likelihood Approach Using Non-Homogeneous Poisson Processes for Software Reliability and Reliability Growth Models; Some Results on Lower Records; Simple Formulas for Means, Variances and Covariances of Order Statistics from Tukeys Lambda Distributions and Their Computations; Immigration Branching Diffusions and their Extinctions; Inference Concerning about a Process Capability; Estimation of Mixing Proportions for O1-Mixtures via Em Algorithm; On Evaluation of the Mean Service Cycle Time in Tandem Queuing Systems; An Algorithm Modelling Stationary Load Condition of a Node in a Transputer Network; Statistical Endpoint Monitoring of Breast Cancer Trials: A Review and Case Study of NSABP Protocol; A Note on Quasilikelihood Estimation for GARCH Models; Some Inferential Problems of Type II Distribution Based on Records; An Autoregressive Disagregatin Method; On the Distribution of Bayesian Invariance Test for Structural Change; On Properties of Statistics Connected with Minimal Spacing and Record Exceedance; Estimation of Common Location parameter of Two Exponential Distributions; The Stock Market: Determi